UC Dependability and Security research Group
The UC Dependability and Security group was established as a unit to co-ordinate and support work in the areas of dependability, security and privacy, resiliency and survivability. For instance, we are working on intrusion detection systems, Wireless Sensor Networks, Cyber physical systems (e.g., Smart Grid), Critical Infrastructures.
Director: Dr. Dong-Seong (Dan) Kim
Lecturer (Assistant Prof. in US system)
dongseong.kim@canterbury.ac.nzMy Homepage
Department of Computer Science and Software Engineering
University of Canterbury
Private Bag 4800
Christchurch
New Zealand
Information for Prospective Students
If you are interested in Dependability and Security and are looking for an supervisor for your Ph.D., Master, or Honours study, please send me an email with THIS INFORMATION. I am always open and happy to discuss with you about the research topics. If you are looking for PostDoc research fellow or visiting scholar positions, pleae email me for details.News
- [16 July, 2013] Jin and DongSeong attended Trustcom2013 to present the paper entitled "Scalable attack Representation Model Using Logic Reduction Techniques" in Melbourne.
- [8 July, 2013] Jin and DongSeong's paper entitled "Scalable Security model Generation and Analysis using k-importance Measure" has been accepted to Securecomm 2013 to be held in Sydney.
- [8 July, 2013] Jin and DongSeong attended SEC2013 conference in Auckland to present the paper "Performance Analysis of Scalable Attack Representation Models".
- [April, 2013] DongSeong's paper entitled "System Resiliency Quantification using Non-state space and state-space models" is now online at Reliability Engineering and System Safety.
- [March, 2013] DongSeong's paper entitled "Modeling and Analysis of Software Rejuvenation in a Server Virtualized System with Live VM migration "is now online at Elsevier Performance Evaluation
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- [Jan. 2013]One of DongSeong's papers entitled "Sensitivity Analysis of Server Virtualized System Availability" has been accepted in IEEE Transactions on Reliability!!